瞬时电压变化率对群脉冲微放电现象的影响

T. Ishida, M. Nagao, M. Kosaki
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引用次数: 4

摘要

利用计算机辅助局部放电分析系统(CAPDAS)研究了CIGRE Method-II样品中SPMD特性的时间变化以及瞬时电压变化率对SPMD的影响。得到以下结论:(1)初始不发生SPMD,但随着老化时间的延长,SPMD逐渐增加,最后几乎所有pd都转变为SPMD。SPMD的出现与绝缘子的劣化有关。孔隙表面粗糙度是影响SPMD形成的主要因素之一。从这些结果可以看出SPMD比对绝缘材料的降解作用。(2)在极低频电压的作用下,不容易发生SPMD。用常规脉冲法测得0.1 Hz时的电荷积分与60 Hz时的电桥值几乎相等。因此,在极低电压和工频电压下,仅使用传统PD检测器就可以定量分析SPMD特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of instantaneous voltage change rate on appearance of swarming pulsive microdischarges
The study investigates the time variation of SPMD characteristics and the effect of the instantaneous voltage change rate on SPMD in a CIGRE Method-II specimen by using the computer aided partial discharge analyzing system (CAPDAS). The following conclusions were obtained. (1) SPMD did not occur at first, but increased with the aging time and finally almost all PDs turned into SPMD. The appearance of SPMD was concerned with the degradation of insulator. The void surface roughness was one of the main factors for the appearance of SPMD. From these results it would be possible to find the degradation of insulating materials by the SPMD ratio. (2) SPMD is less likely to occur under the application of the very low frequency voltage. The charge integral at 0.1 Hz measured with the conventional pulse method was almost equal to the bridge value at 60 Hz. Therefore the quantitative analysis of SPMD characteristics becomes possible using only the conventional PD detector under the voltage application of both very low and power frequency.
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