C. Viegas, B. Alderman, F. A. Muhammad, P. Huggard, C. Duff, R. Sloan, J. Powell
{"title":"复合材料的宽带太赫兹成像","authors":"C. Viegas, B. Alderman, F. A. Muhammad, P. Huggard, C. Duff, R. Sloan, J. Powell","doi":"10.1109/IMWS-AMP.2016.7588333","DOIUrl":null,"url":null,"abstract":"Imaging composite materials is a challenging task due to the continual improvement in material quality and inspection demands. This paper describes a novel broadband THz noise mapping technique that performs active imaging of composite materials. The transmission measurement consists of an amplified photonic noise source to illuminate the sample and a W-band Schottky diode based radiometer to obtain the intensity profile as a function of scan position. The experimental set-up and preliminary results are presented.","PeriodicalId":132755,"journal":{"name":"2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Broadband THz imaging of composite materials\",\"authors\":\"C. Viegas, B. Alderman, F. A. Muhammad, P. Huggard, C. Duff, R. Sloan, J. Powell\",\"doi\":\"10.1109/IMWS-AMP.2016.7588333\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Imaging composite materials is a challenging task due to the continual improvement in material quality and inspection demands. This paper describes a novel broadband THz noise mapping technique that performs active imaging of composite materials. The transmission measurement consists of an amplified photonic noise source to illuminate the sample and a W-band Schottky diode based radiometer to obtain the intensity profile as a function of scan position. The experimental set-up and preliminary results are presented.\",\"PeriodicalId\":132755,\"journal\":{\"name\":\"2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMWS-AMP.2016.7588333\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMWS-AMP.2016.7588333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Imaging composite materials is a challenging task due to the continual improvement in material quality and inspection demands. This paper describes a novel broadband THz noise mapping technique that performs active imaging of composite materials. The transmission measurement consists of an amplified photonic noise source to illuminate the sample and a W-band Schottky diode based radiometer to obtain the intensity profile as a function of scan position. The experimental set-up and preliminary results are presented.
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