伪随机数生成器统计检验的优化

2016 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW) Pub Date : 2016-02-01 DOI:10.1109/EICONRUSNW.2016.7448151

I. Chugunkov, A. O. Prokofiev, P. A. Strelchenko

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引用次数: 2

摘要

本文讨论了评价伪随机数生成器的统计检验的有效性。提出了一种减少伪随机序列检验中假阴性数的方法。我们讨论了该方法对特定测试的适用性，并提供了基于测试显著性的置信区间的计算。我们还描述了基于缺勤数计算的方法。它减少了测试实现的内存需求。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The optimization of statistical tests for pseudorandom number generators

This paper discusses the efficiency of statistical tests for evaluating of pseudorandom number generators. We present the method to reduce a number of false negatives for pseudorandom sequences testing. We discuss this method applicability for specific tests and provide calculations of confidence intervals based on the tests significance. Also we describe the approach based on the calculation of the number of absences. It reduces the memory requirements for the tests implementation.

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2016 IEEE NW Russia Young Researchers in Electrical and Electronic Engineering Conference (EIConRusNW)

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