{"title":"交互式可测试性分析程序- ITTAP","authors":"D. K. Goel, R. M. McDermott","doi":"10.1145/800263.809262","DOIUrl":null,"url":null,"abstract":"ITTAP is a testability analysis program developed at the ITT-LSI technology center. In this paper we describe a testability measure for the test length and discuss the use of the selective trace concept for testability calculations. It is shown that ITTAP provides an order of magnitude improvement in run time over existing programs like SCOAP.","PeriodicalId":290739,"journal":{"name":"19th Design Automation Conference","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"An Interactive Testability Analysis Program - ITTAP\",\"authors\":\"D. K. Goel, R. M. McDermott\",\"doi\":\"10.1145/800263.809262\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ITTAP is a testability analysis program developed at the ITT-LSI technology center. In this paper we describe a testability measure for the test length and discuss the use of the selective trace concept for testability calculations. It is shown that ITTAP provides an order of magnitude improvement in run time over existing programs like SCOAP.\",\"PeriodicalId\":290739,\"journal\":{\"name\":\"19th Design Automation Conference\",\"volume\":\"68 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"19th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/800263.809262\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/800263.809262","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Interactive Testability Analysis Program - ITTAP
ITTAP is a testability analysis program developed at the ITT-LSI technology center. In this paper we describe a testability measure for the test length and discuss the use of the selective trace concept for testability calculations. It is shown that ITTAP provides an order of magnitude improvement in run time over existing programs like SCOAP.