{"title":"一种新的系统诊断方法","authors":"S. Xu, J. Gao","doi":"10.1109/ATS.1993.398794","DOIUrl":null,"url":null,"abstract":"With the advent of parallel computing systems, the fault diagnosis of such systems becomes increasingly challenging and critical. In this paper, we first introduce the concept of binary decision diagram (BDD), based on which we present an efficient way to locate the faulty units according to what we call fault symptom (FS). The new technique is then proved to be optimal (shortest) in time-consuming. Finally, an intelligent searching procedure for fault diagnosis is given.<<ETX>>","PeriodicalId":228291,"journal":{"name":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new method for system diagnosis\",\"authors\":\"S. Xu, J. Gao\",\"doi\":\"10.1109/ATS.1993.398794\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the advent of parallel computing systems, the fault diagnosis of such systems becomes increasingly challenging and critical. In this paper, we first introduce the concept of binary decision diagram (BDD), based on which we present an efficient way to locate the faulty units according to what we call fault symptom (FS). The new technique is then proved to be optimal (shortest) in time-consuming. Finally, an intelligent searching procedure for fault diagnosis is given.<<ETX>>\",\"PeriodicalId\":228291,\"journal\":{\"name\":\"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-11-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1993.398794\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1993.398794","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
With the advent of parallel computing systems, the fault diagnosis of such systems becomes increasingly challenging and critical. In this paper, we first introduce the concept of binary decision diagram (BDD), based on which we present an efficient way to locate the faulty units according to what we call fault symptom (FS). The new technique is then proved to be optimal (shortest) in time-consuming. Finally, an intelligent searching procedure for fault diagnosis is given.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
