DFT关闭

F. Hayat, T. Williams, R. Kapur, D. Hsu
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引用次数: 5

摘要

很明显,可测试性必须贯穿于整个设计过程。为了成功地满足当今和未来极其复杂的器件的所有设计目标,功能、时序、面积和功率要求的快速收敛必须同时伴随着新的测试工具,以实现快速、可预测和可重复的DFT关闭。实现成功的DFT闭合需要RTL设计人员和DFT工程师在统一的设计视图上协同工作,使用集成的工具和流程。它还要求DFT工具对至关重要的定时关闭流没有任何影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DFT closure
It is becoming evident that testability must be addressed throughout the entire design process. To successfully meet all the design goals of today's and tomorrow's enormously complex devices, swift convergence of function, timing, area and power requirements must be simultaneously accompanied by new test tools that enable rapid, predictable and repeatable DFT closure. Achieving successful DFT closure requires that RTL designers and DFT engineers work in concert on a unified view of the design, using integrated tools and flows. It also requires that DFT tools have zero impact on critically important timing closure flows.
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