S. Udovenko, A. Filimonov, S. Vakhrushev, D. Chernyshov, B. Loginov, Pavel Karev
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A System for Simultaneous Application of Uniaxial Strain and Electric Field to the Crystal Sample in Wide Temperature Range for X-Ray Scattering Experiments
The sample cell for the single crystal X-ray diffraction measurements under simultaneous application of the controllable uniaxial tensile strain and electric field in a wide temperature range is described. The details of the cell design are discussed. Test diffraction measurements were performed with 0.67PbMg1/3Nb2/3O3-0.33PbTiO3 (0.67PMN-0.33PT) single crystal. The sample had platelet shape thinned in central part. Here we present experimental results, acquired with a new system.