用于测量数字CMOS VLSI电路中干扰的串扰传感器实现

J. A. Sainz, R. Muñoz, J. Maiz, L. A. Aguado, M. Roca
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引用次数: 4

摘要

提出了一种测量数字CMOS VLSI电路串扰的方法。串扰传感器采用0.8 /spl mu/m AMS(奥地利Mikro系统)技术,其设计基于NOR和NAND RS锁存器。干扰是由影响线上的上(下)跃迁产生的。串扰传感器用于测量长金属线之间电容耦合产生的串扰干扰幅度。该传感器是可编程的,用于测量串扰幅度的一些范围。传感器的设计是基于基本NOR和NAND门的动态行为,这取决于MOS晶体管的尺寸。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A crosstalk sensor implementation for measuring interferences in digital CMOS VLSI circuits
This paper presents an approach for measuring crosstalk interference in digital CMOS VLSI circuits. The crosstalk sensor has been implemented in 0.8 /spl mu/m AMS (Austria Mikro Systeme) technology and its design is based on NOR and NAND RS latches. The interference is produced by an up (down) transition in an affecting line. The crosstalk sensor is designed to measure crosstalk interference amplitude produced by capacitive coupling between long metal lines. The sensor is programmable for measuring some ranges of crosstalk amplitude. The sensor design is based on the dynamic behavior of basic NOR and NAND gates depending on the MOS transistor sizes.
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