{"title":"通过一个例子回顾延迟的统计变化","authors":"Valeriu Beiu, M. Tache","doi":"10.1109/SMICND.2015.7355200","DOIUrl":null,"url":null,"abstract":"This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.","PeriodicalId":325576,"journal":{"name":"2015 International Semiconductor Conference (CAS)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Revisiting delay variations statistically through an example\",\"authors\":\"Valeriu Beiu, M. Tache\",\"doi\":\"10.1109/SMICND.2015.7355200\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.\",\"PeriodicalId\":325576,\"journal\":{\"name\":\"2015 International Semiconductor Conference (CAS)\",\"volume\":\"69 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 International Semiconductor Conference (CAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMICND.2015.7355200\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2015.7355200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Revisiting delay variations statistically through an example
This paper details preliminary results for a novel statistical analysis, using the delay of an inverter (the basic element of SRAM cells) as an example. The results obtained are statistically meaningful, and should allow for more accurate, faster, and better yield estimates.
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