{"title":"基于sram的FPGA通过配置帧实现容错","authors":"Farid Lahrach, A. Doumar, E. Châtelet","doi":"10.1109/DDECS.2011.5783066","DOIUrl":null,"url":null,"abstract":"Fault tolerance is an important system metric to increase chip reliability. The conventional technique for improving system reliability is through component replication, which usually comes at significant cost: increased design time, testing, power consumption, volume and weight. In this contribution, we propose a technique based on partial dynamic reconfiguration (PDR) to tolerate faults in configurable logic blocks (CLBs) and routing resources (RRs). The fault tolerance is achieved through SRAM cells of configuration frames. Our method do not require preallocated spare CLBs or RRs. The reliability of frames is analyzed and improved.","PeriodicalId":231389,"journal":{"name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","volume":"170 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Fault tolerance of SRAM-based FPGA via configuration frames\",\"authors\":\"Farid Lahrach, A. Doumar, E. Châtelet\",\"doi\":\"10.1109/DDECS.2011.5783066\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fault tolerance is an important system metric to increase chip reliability. The conventional technique for improving system reliability is through component replication, which usually comes at significant cost: increased design time, testing, power consumption, volume and weight. In this contribution, we propose a technique based on partial dynamic reconfiguration (PDR) to tolerate faults in configurable logic blocks (CLBs) and routing resources (RRs). The fault tolerance is achieved through SRAM cells of configuration frames. Our method do not require preallocated spare CLBs or RRs. The reliability of frames is analyzed and improved.\",\"PeriodicalId\":231389,\"journal\":{\"name\":\"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems\",\"volume\":\"170 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2011.5783066\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2011.5783066","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fault tolerance of SRAM-based FPGA via configuration frames
Fault tolerance is an important system metric to increase chip reliability. The conventional technique for improving system reliability is through component replication, which usually comes at significant cost: increased design time, testing, power consumption, volume and weight. In this contribution, we propose a technique based on partial dynamic reconfiguration (PDR) to tolerate faults in configurable logic blocks (CLBs) and routing resources (RRs). The fault tolerance is achieved through SRAM cells of configuration frames. Our method do not require preallocated spare CLBs or RRs. The reliability of frames is analyzed and improved.