{"title":"LSI测试:成功LSI产业的核心技术","authors":"X. Wen","doi":"10.1109/ASICON52560.2021.9620418","DOIUrl":null,"url":null,"abstract":"Despite its ever-growing importance in all innovation fields, such as automotive and IoT applications, the LSI industry is fragile due to its a weak technology-business chain. In addition, its products, namely LSI chips, are vulnerable to six risks (defective chip escape, radiation, aging, malicious attack, counterfeiting). LSI testing is the technology that is indispensable to mitigate these risks. This paper highlights the intent of LSI testing as well as its impact on the LSI industry.","PeriodicalId":233584,"journal":{"name":"2021 IEEE 14th International Conference on ASIC (ASICON)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"LSI Testing: A Core Technology to a Successful LSI Industry\",\"authors\":\"X. Wen\",\"doi\":\"10.1109/ASICON52560.2021.9620418\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Despite its ever-growing importance in all innovation fields, such as automotive and IoT applications, the LSI industry is fragile due to its a weak technology-business chain. In addition, its products, namely LSI chips, are vulnerable to six risks (defective chip escape, radiation, aging, malicious attack, counterfeiting). LSI testing is the technology that is indispensable to mitigate these risks. This paper highlights the intent of LSI testing as well as its impact on the LSI industry.\",\"PeriodicalId\":233584,\"journal\":{\"name\":\"2021 IEEE 14th International Conference on ASIC (ASICON)\",\"volume\":\"84 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 14th International Conference on ASIC (ASICON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASICON52560.2021.9620418\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 14th International Conference on ASIC (ASICON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASICON52560.2021.9620418","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LSI Testing: A Core Technology to a Successful LSI Industry
Despite its ever-growing importance in all innovation fields, such as automotive and IoT applications, the LSI industry is fragile due to its a weak technology-business chain. In addition, its products, namely LSI chips, are vulnerable to six risks (defective chip escape, radiation, aging, malicious attack, counterfeiting). LSI testing is the technology that is indispensable to mitigate these risks. This paper highlights the intent of LSI testing as well as its impact on the LSI industry.