{"title":"各种统计过程控制方法的综述","authors":"S. Kumar","doi":"10.1109/IEMT.1991.279821","DOIUrl":null,"url":null,"abstract":"The author discusses the various statistical process control (SPC) techniques currently being used by different industries. He also introduces a few nonconventional SPC charts which were published recently and could be used for better results. He also describes the Motorola method of performing characterization of processes.<<ETX>>","PeriodicalId":127257,"journal":{"name":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","volume":"28 24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Survey of various statistical process control methods\",\"authors\":\"S. Kumar\",\"doi\":\"10.1109/IEMT.1991.279821\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author discusses the various statistical process control (SPC) techniques currently being used by different industries. He also introduces a few nonconventional SPC charts which were published recently and could be used for better results. He also describes the Motorola method of performing characterization of processes.<<ETX>>\",\"PeriodicalId\":127257,\"journal\":{\"name\":\"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"volume\":\"28 24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1991.279821\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1991.279821","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Survey of various statistical process control methods
The author discusses the various statistical process control (SPC) techniques currently being used by different industries. He also introduces a few nonconventional SPC charts which were published recently and could be used for better results. He also describes the Motorola method of performing characterization of processes.<>