{"title":"基于解析热模型的电子电路温度监测","authors":"M. Janicki, A. Napieralski","doi":"10.1109/ICMEL.2000.838758","DOIUrl":null,"url":null,"abstract":"This paper presents a method of integrated circuit temperature monitoring based on an analytical thermal model. First, a thermal model of a real power integrated circuit is created. Then, power dissipated in transistors is estimated from noisy temperature sensor measurements. The quality of estimate is enhanced owing to the use of the QR-RLS adaptive algorithm.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Temperature monitoring of electronic circuits based on analytical thermal model\",\"authors\":\"M. Janicki, A. Napieralski\",\"doi\":\"10.1109/ICMEL.2000.838758\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method of integrated circuit temperature monitoring based on an analytical thermal model. First, a thermal model of a real power integrated circuit is created. Then, power dissipated in transistors is estimated from noisy temperature sensor measurements. The quality of estimate is enhanced owing to the use of the QR-RLS adaptive algorithm.\",\"PeriodicalId\":215956,\"journal\":{\"name\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"volume\":\"79 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEL.2000.838758\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.838758","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Temperature monitoring of electronic circuits based on analytical thermal model
This paper presents a method of integrated circuit temperature monitoring based on an analytical thermal model. First, a thermal model of a real power integrated circuit is created. Then, power dissipated in transistors is estimated from noisy temperature sensor measurements. The quality of estimate is enhanced owing to the use of the QR-RLS adaptive algorithm.