{"title":"随机碳纳米管在场发射过程中的行为建模","authors":"N. Sinha, J. Yeow","doi":"10.1109/ICMENS.2005.75","DOIUrl":null,"url":null,"abstract":"Carbon nanotubes (CNTs) have emerged as promising electron emitters in recent years because of their low threshold electric field for emission and a high emission current density. These features make them attractive for many technological applications such as cold cathode electron sources for a variety of vacuum electronic devices. In this paper, we model the behavior of randomly oriented CNTs during field emission under the influence of external electric field.","PeriodicalId":185824,"journal":{"name":"2005 International Conference on MEMS,NANO and Smart Systems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Modeling of the behavior of random carbon nanotubes during field emission\",\"authors\":\"N. Sinha, J. Yeow\",\"doi\":\"10.1109/ICMENS.2005.75\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Carbon nanotubes (CNTs) have emerged as promising electron emitters in recent years because of their low threshold electric field for emission and a high emission current density. These features make them attractive for many technological applications such as cold cathode electron sources for a variety of vacuum electronic devices. In this paper, we model the behavior of randomly oriented CNTs during field emission under the influence of external electric field.\",\"PeriodicalId\":185824,\"journal\":{\"name\":\"2005 International Conference on MEMS,NANO and Smart Systems\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-07-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 International Conference on MEMS,NANO and Smart Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMENS.2005.75\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Conference on MEMS,NANO and Smart Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMENS.2005.75","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling of the behavior of random carbon nanotubes during field emission
Carbon nanotubes (CNTs) have emerged as promising electron emitters in recent years because of their low threshold electric field for emission and a high emission current density. These features make them attractive for many technological applications such as cold cathode electron sources for a variety of vacuum electronic devices. In this paper, we model the behavior of randomly oriented CNTs during field emission under the influence of external electric field.