{"title":"一种选择内置测试装置的方法","authors":"A. Rosin","doi":"10.1109/ARMS.1990.67981","DOIUrl":null,"url":null,"abstract":"A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An approach to the selection of built-in-test devices\",\"authors\":\"A. Rosin\",\"doi\":\"10.1109/ARMS.1990.67981\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<<ETX>>\",\"PeriodicalId\":383597,\"journal\":{\"name\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-01-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Proceedings on Reliability and Maintainability Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARMS.1990.67981\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An approach to the selection of built-in-test devices
A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<>
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