{"title":"确定垂直腔面发射激光器横模结构的相位恢复方法","authors":"M.I. Cohen, A. Rakić, M. Majewski","doi":"10.1109/COMMAD.1996.610070","DOIUrl":null,"url":null,"abstract":"The transverse mode properties of vertical-cavity surface-emitting lasers (VCSELs) are investigated by spectrally resolved beam profiling. Near field and far field intensity distributions were measured for a top emitting index guided VCSEL. The Gerchberg-Saxton algorithm was employed to retrieve the phase across the laser aperture.","PeriodicalId":171952,"journal":{"name":"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Phase retrieval methods for the determination of transverse mode structure in vertical-cavity surface-emitting lasers\",\"authors\":\"M.I. Cohen, A. Rakić, M. Majewski\",\"doi\":\"10.1109/COMMAD.1996.610070\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The transverse mode properties of vertical-cavity surface-emitting lasers (VCSELs) are investigated by spectrally resolved beam profiling. Near field and far field intensity distributions were measured for a top emitting index guided VCSEL. The Gerchberg-Saxton algorithm was employed to retrieve the phase across the laser aperture.\",\"PeriodicalId\":171952,\"journal\":{\"name\":\"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/COMMAD.1996.610070\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COMMAD.1996.610070","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Phase retrieval methods for the determination of transverse mode structure in vertical-cavity surface-emitting lasers
The transverse mode properties of vertical-cavity surface-emitting lasers (VCSELs) are investigated by spectrally resolved beam profiling. Near field and far field intensity distributions were measured for a top emitting index guided VCSEL. The Gerchberg-Saxton algorithm was employed to retrieve the phase across the laser aperture.