dram串扰诱发故障分析

IEEE International SOC Conference, 2004. Proceedings. Pub Date : 2004-11-30 DOI:10.1109/SOCC.2004.1362395

Zemo Yang, S. Mourad

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引用次数: 0

摘要

本文着重分析了读操作中位线间的串扰，特别是在存在缺陷和参数变化的情况下。我们将这类故障识别为串音读取(CTR)故障。对这些断层进行了分析研究，并以广泛的模拟结果支持了研究。

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Crosstalk induced fault analysis in DRAMs

In this paper we focus on the analysis of crosstalk among the bit-lines during the read operation, especially when defect and parameter variations exist. We identify such faults as crosstalk reading (CTR) faults. An analytical study of these faults was done and we supported the study with extensive simulation results.

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IEEE International SOC Conference, 2004. Proceedings.

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