{"title":"基于遗传算法辅助神经网络的f类功率放大器GaN HEMT模型开发及其CAD集成论证","authors":"S. Husain, G. Nauryzbayev, Mohammad S. Hashmi","doi":"10.1109/EDTM55494.2023.10102998","DOIUrl":null,"url":null,"abstract":"Gallium nitride (GaN) high electron mobility transistors (HEMTs) are quintessential prospect for the design of state-of-the-art power amplifiers (PAs). Within this context, this paper systematically investigates and realizes an integration of genetic algorithm aided artificial neural network based small-signal model into a computer-aided design (CAD) tool to elucidate the small-signal behaviour of a GaN HEMT employed class-F PA. Thereafter, an examination of amplifiers' stability and gain are expressed for the entire frequency of operation.","PeriodicalId":418413,"journal":{"name":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"GA Assisted ANN based GaN HEMT Model Development and Demonstration of its CAD Incorporation for Class-F Power Amplifier\",\"authors\":\"S. Husain, G. Nauryzbayev, Mohammad S. Hashmi\",\"doi\":\"10.1109/EDTM55494.2023.10102998\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Gallium nitride (GaN) high electron mobility transistors (HEMTs) are quintessential prospect for the design of state-of-the-art power amplifiers (PAs). Within this context, this paper systematically investigates and realizes an integration of genetic algorithm aided artificial neural network based small-signal model into a computer-aided design (CAD) tool to elucidate the small-signal behaviour of a GaN HEMT employed class-F PA. Thereafter, an examination of amplifiers' stability and gain are expressed for the entire frequency of operation.\",\"PeriodicalId\":418413,\"journal\":{\"name\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTM55494.2023.10102998\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM55494.2023.10102998","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
GA Assisted ANN based GaN HEMT Model Development and Demonstration of its CAD Incorporation for Class-F Power Amplifier
Gallium nitride (GaN) high electron mobility transistors (HEMTs) are quintessential prospect for the design of state-of-the-art power amplifiers (PAs). Within this context, this paper systematically investigates and realizes an integration of genetic algorithm aided artificial neural network based small-signal model into a computer-aided design (CAD) tool to elucidate the small-signal behaviour of a GaN HEMT employed class-F PA. Thereafter, an examination of amplifiers' stability and gain are expressed for the entire frequency of operation.