{"title":"基于分割、填充和特征比较的PCB图像缺陷链自动检测","authors":"R. Melnyk, Yevheniya Levus, R. Tushnytskyy","doi":"10.1109/CSIT56902.2022.10000482","DOIUrl":null,"url":null,"abstract":"An approach to divide the PCB board into parts to increase visibility of defects is considered. The flood-fill algorithm is usedto color and to separates the PCB chains components. To measure a defect values a mean intensity functions and distributed cumulative histograms are applied to PCB components to detect defects places and intensity","PeriodicalId":282561,"journal":{"name":"2022 IEEE 17th International Conference on Computer Sciences and Information Technologies (CSIT)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Automatic Defective Chains Detection in PCB Image by Partition, Flood-Filling and Features Comparison\",\"authors\":\"R. Melnyk, Yevheniya Levus, R. Tushnytskyy\",\"doi\":\"10.1109/CSIT56902.2022.10000482\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An approach to divide the PCB board into parts to increase visibility of defects is considered. The flood-fill algorithm is usedto color and to separates the PCB chains components. To measure a defect values a mean intensity functions and distributed cumulative histograms are applied to PCB components to detect defects places and intensity\",\"PeriodicalId\":282561,\"journal\":{\"name\":\"2022 IEEE 17th International Conference on Computer Sciences and Information Technologies (CSIT)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 17th International Conference on Computer Sciences and Information Technologies (CSIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSIT56902.2022.10000482\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 17th International Conference on Computer Sciences and Information Technologies (CSIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSIT56902.2022.10000482","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic Defective Chains Detection in PCB Image by Partition, Flood-Filling and Features Comparison
An approach to divide the PCB board into parts to increase visibility of defects is considered. The flood-fill algorithm is usedto color and to separates the PCB chains components. To measure a defect values a mean intensity functions and distributed cumulative histograms are applied to PCB components to detect defects places and intensity