基于硅的大面积(>500 mm2) 3d歧管嵌入式微冷却器器件的微制造挑战,用于高热流通量去除

Sougata Hazra, Alisha Piazza, K. Jung, M. Asheghi, M. Gupta, E. Jih, M. Degner, K. Goodson
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引用次数: 2

摘要

3D歧管嵌入式微冷却器(3DMMC)设备正变得越来越有吸引力,因此,寻求高功率密度电子元件和设备的主动冷却解决方案。3d - mmc已经显示出有效冷却极端热流的潜力,这是高功率密度电子和微处理器的特点。尽管大量的研究已经通过实验证明了小面积(25mm2)微型冷却器的良好性能,但与制造大面积(> 500mm2)相关的挑战尚未得到充分的讨论或记录。本研究详细讨论了一种经过验证的、可重复的、可靠的工艺流程,用于通过硅片微处理制造尺寸从10 mm2到1000 mm2的3D-MMC器件热点区域。具体来说,本研究深入研究了高纵横比(>10)各向异性硅蚀刻,这是这种微流体器件的特征。此外,我们通过讨论在深Si蚀刻步骤中经常遇到的几个问题,即通过光刻胶微掩膜形成黑Si,由深蚀刻引起的高表面粗糙度和蚀刻速率下降,提供了对深反应离子蚀刻(DRIE)工艺开发的见解。我们已经证明了在蚀刻过程中调整蚀刻和钝化周期时间的重要性,通过表明仅改变10%的周期时间就可以完全消除这些问题-这一信息对硅微制造社区具有广泛的价值。本研究旨在记录和传播一种可靠的高纵横比深Si刻蚀配方,该配方可用于制造高性能大面积微冷却器器件,并有望成为制造工作和新配方开发的起点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Microfabrication Challenges for Silicon-based Large Area (>500 mm2) 3D-manifolded Embedded Microcooler Devices for High Heat Flux Removal
3D Manifolded embedded Micro-Coolers (3DMMC) devices are becoming increasingly attractive and thereby, sought after active cooling solutions for high power density electronic components and devices. 3D-MMCs have shown the potential to effectively cool extreme levels of heat flux, characteristic of high- power density electronics and microprocessors. Despite numerous studies that have experimentally demonstrated promising performance of small area (25 mm2) micro-coolers, the challenges associated with fabrication of large area (>500 mm2) have not been adequately discussed or documented. This study discusses in details, a well validated, repeatable and reliable process flow for making 3D-MMC devices of sizes ranging from 10 mm2 to 1000 mm2 hotspot area via Silicon wafer microprocessing. Specifically, this study delves deep into the high aspect ratio (>10) anisotropic Silicon etching that is characteristic of such microfluidic devices. Additionally, we have provided insight into process development in Deep Reactive Ion Etching (DRIE) by discussing several issues that are frequently encountered during this deep Si etching step, namely, formation of black Si by photoresist micro-masking, high surface roughness resulting from deep etching and etch rate drop off. We have demonstrated the importance of tweaking etching and passivation cycle times during etching, by showing that merely 10% change in cycle times can eliminate these problems completely - this information is widely valuable to the Silicon microfabrication community. This study aims to document and disseminate a reliable high aspect ratio deep Si etching recipe that can be used to fabricate high performance large area microcooler devices, and will hopefully act as a starting point for fabrication efforts and new recipe development.
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