基于核心设计的计算机辅助测试流程

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) Pub Date : 2000-12-01 DOI:10.1109/ICMEL.2000.838790

V. Zivkovic, R. Tangelder, H. Kerkhoff

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引用次数: 5

摘要

本文研究了基于核心的设计中测试模式的生成和故障覆盖的确定。本文阐述了在基于核心的设计中必须应用的基本核心测试策略。提出了一种计算机辅助测试(CAT)流程，实现了嵌入式核的准确故障覆盖。CAT现在应用于飞利浦核心测试试点IC项目中的几个核心。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Computer-aided test flow in core-based design

This paper copes with the test-pattern generation and fault coverage determination in the core based design. The basic core-test strategy that one has to apply in the core-based design is stated in this work. A Computer-Aided Test (CAT) flow is proposed resulting in accurate fault coverage of embedded cores. The CAT now is applied to a few cores within the Philips Core Test Pilot IC project.

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来源期刊

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)

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