全悬架冗余环的可靠性研究

F. Flourens, D. Peyrou, K. Yacine, S. Mellé, K. Grenier, D. Dubuc, A. Boukabache, P. Pons, R. Plana
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引用次数: 0

摘要

本文报道了一种用于毫米波应用的悬式冗余环的可靠性研究。当提出一种原始方法来研究电容式MEMS中的充电效应时,力学表征表明没有重大故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability investigation on a fully suspended redundancy ring
This paper reports on the reliability investigation on a suspended redundancy ring for millimeter wave applications. Mechanical characterization has shown no major failure when an original method is presented to investigate the charging effect in a capacitive MEMS.
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