完全耗尽SOI mosfet中的浮体扭结和动态效应

S. Krishnan, J. Fossum, P. Yeh, O. Faynot, S. Cristoloveanu, J. Gautier
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引用次数: 10

摘要

全耗尽(FD) SOI CMOS是低压集成电路应用的有力竞争者。然而,随着FD/SOI mosfet的缩放,以前看起来微不足道的浮体效应变得重要起来。在本文中,我们报告了高尺度FD/SOI mosfet测量的亚阈值电流电压特性中的扭结,并描述和建模了潜在的物理机制,显示了它与部分耗尽(PD)器件中常见的扭结效应的不同之处。所提供的见解限定了FD/SOI的含义,并暗示了低压SOI CMOS的新设计问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Floating-body kinks and dynamic effects in fully depleted SOI MOSFETs
Fully depleted (FD) SOI CMOS is a contender for low-voltage IC applications. However, as FD/SOI MOSFETs are scaled, floating-body effects, which previously seemed insignificant, become important. In this paper, we report kinks in the measured subthreshold current-voltage characteristics of highly scaled FD/SOI MOSFETs, and we describe and model the underlying physical mechanism, showing how it differs from the familiar kink effect in partially depleted (PD) devices. The insight afforded qualifies the meaning of FD/SOI and implies new design issues for low-voltage SOI CMOS.
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