一种制备MPI示踪粒子的新方法

2013 International Workshop on Magnetic Particle Imaging (IWMPI) Pub Date : 2013-03-23 DOI:10.1109/IWMPI.2013.6528366

J. Jacobsohn, Mahmoud Reza Rahbar Azad, F. Biebl, A. Meyer, H. Oepen

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引用次数: 0

摘要

磁颗粒成像(MPI)依靠超顺磁性氧化铁颗粒(SPIO)作为示踪颗粒。spio的直径只有几纳米，饱和磁化强度低，这严重限制了MPI中可获得的信号。B. Gleich和J. Weizenecker在他们首次提出MPI概念时就已经认识到这一点。为了解决这一问题，研究的重点是多芯纳米颗粒[2]和更大芯直径的spio。

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A new approach to the fabrication of tracer particles for MPI

Magnetic Particle Imaging (MPI) relies on superparamagnetic iron oxide particles (SPIO) as tracer particles. SPIOs have diameters of only a few nanometers and a low saturation magnetization, which severely limits the obtainable signal in MPI. This was already recognized by B. Gleich and J. Weizenecker in their first presentation of the MPI concept [1]. In order to solve this problem research has been focused on multicore nanoparticles [2] and on SPIOs with larger core diameters [3].

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2013 International Workshop on Magnetic Particle Imaging (IWMPI)

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