采用多级单元STT-RAM实现快速高效的本地检查点

Ping Chi, Cong Xu, Zhang Tao, Xiangyu Dong, Yuan Xie
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引用次数: 25

摘要

高可靠性、可用性和可服务性对现代大规模计算系统至关重要。检查点作为一种有效的错误恢复机制,在此类系统中得到了广泛的应用。然而,由于基于dram的主存储器和备份存储器之间的I/O带宽有限,传统的检查点方案非常耗时。为了减少检查点开销,我们提出了一种利用多级单元(MLC) STT-RAM的快速本地检查点方案。我们利用MLC STT-RAM的独特功能来加速本地检查点。我们的实验结果表明,在多编程的四核进程节点中,平均性能开销小于1%,本地检查点间隔为1秒。评估结果还表明,使用MLC STT-RAM是一种节能的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Using multi-level cell STT-RAM for fast and energy-efficient local checkpointing
High reliability, availability, and serviceability are critical for modern large-scale computing systems. As an effective error recovery mechanism, checkpointing has been widely used in such systems for their survival from unexpected failures. The conventional checkpointing schemes, however, are time-consuming due to the limited I/O bandwidth between the DRAM-based main memory and the backup storage. To mitigate the checkpoint overhead, we propose a fast local checkpointing scheme by leveraging Multi-Level Cell (MLC) STT-RAM. We take advantage of the unique features of MLC STT-RAM to accelerate local checkpointing. Our experimental results show that the average performance overhead is less than 1% in a multi-programmed four-core process node with a 1-second local checkpoint interval. The evaluation results also demonstrate that using MLC STT-RAM is an energy-efficient solution.
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