Xiang Zhou, M. Fukui, K. Takeuchi, T. Saraya, T. Hiramoto
{"title":"3300V比例igbt中抑制动态雪崩和增强关断dV/dt可控性","authors":"Xiang Zhou, M. Fukui, K. Takeuchi, T. Saraya, T. Hiramoto","doi":"10.1109/EDTM55494.2023.10103121","DOIUrl":null,"url":null,"abstract":"Dynamic performance has been compared systematically among 3300V scaled IGBTs with scaling factor (k) from 1 to 10 by TCAD simulations. Even with much stronger Injection Enhancement (IE) effect, Dynamic Avalanche (DA) in scaled IGBTs is proven to be more suppressed than in $\\mathrm{k}=1$ case, and it's demonstrated that IGBT scaling is able to break through the trade-off between lower on-state voltage drop and better switching controllability.","PeriodicalId":418413,"journal":{"name":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Suppressed Dynamic Avalanche and Enhanced Turn-off dV/dt Controllability in 3300V Scaled IGBTs\",\"authors\":\"Xiang Zhou, M. Fukui, K. Takeuchi, T. Saraya, T. Hiramoto\",\"doi\":\"10.1109/EDTM55494.2023.10103121\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dynamic performance has been compared systematically among 3300V scaled IGBTs with scaling factor (k) from 1 to 10 by TCAD simulations. Even with much stronger Injection Enhancement (IE) effect, Dynamic Avalanche (DA) in scaled IGBTs is proven to be more suppressed than in $\\\\mathrm{k}=1$ case, and it's demonstrated that IGBT scaling is able to break through the trade-off between lower on-state voltage drop and better switching controllability.\",\"PeriodicalId\":418413,\"journal\":{\"name\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTM55494.2023.10103121\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM55494.2023.10103121","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Suppressed Dynamic Avalanche and Enhanced Turn-off dV/dt Controllability in 3300V Scaled IGBTs
Dynamic performance has been compared systematically among 3300V scaled IGBTs with scaling factor (k) from 1 to 10 by TCAD simulations. Even with much stronger Injection Enhancement (IE) effect, Dynamic Avalanche (DA) in scaled IGBTs is proven to be more suppressed than in $\mathrm{k}=1$ case, and it's demonstrated that IGBT scaling is able to break through the trade-off between lower on-state voltage drop and better switching controllability.