未来存储器技术,包括新兴存储器

K. Kim, G. Koh
{"title":"未来存储器技术,包括新兴存储器","authors":"K. Kim, G. Koh","doi":"10.1109/ICMEL.2004.1314646","DOIUrl":null,"url":null,"abstract":"There have been concerns about how far we can extend the so far so successful conventional semiconductor memories Such as DRAM, SRAM and Flash memory and what will be the future directions of memory development. In this article, we will review the key technical limits of conventional memory scaling and the directions to overcome the problem. In addition, we will review the technical challenges and opportunities of emerging. new memories such as ferroelectric RAM (FRAM), magnetic RAM (MRAM) and phase change RAM (PRAM) which has been recently focused as candidates for ideal memory which can solve the problems of conventional memories.","PeriodicalId":202761,"journal":{"name":"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"29","resultStr":"{\"title\":\"Future memory technology including emerging new memories\",\"authors\":\"K. Kim, G. Koh\",\"doi\":\"10.1109/ICMEL.2004.1314646\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"There have been concerns about how far we can extend the so far so successful conventional semiconductor memories Such as DRAM, SRAM and Flash memory and what will be the future directions of memory development. In this article, we will review the key technical limits of conventional memory scaling and the directions to overcome the problem. In addition, we will review the technical challenges and opportunities of emerging. new memories such as ferroelectric RAM (FRAM), magnetic RAM (MRAM) and phase change RAM (PRAM) which has been recently focused as candidates for ideal memory which can solve the problems of conventional memories.\",\"PeriodicalId\":202761,\"journal\":{\"name\":\"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"29\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEL.2004.1314646\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2004.1314646","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 29

摘要

人们一直担心,到目前为止,我们能将DRAM、SRAM和闪存等传统半导体存储器扩展到什么程度,以及存储器发展的未来方向是什么。在本文中,我们将回顾传统内存扩展的关键技术限制以及克服该问题的方向。此外,我们将回顾新出现的技术挑战和机遇。新型存储器,如铁电RAM (FRAM)、磁性RAM (MRAM)和相变RAM (PRAM),最近成为解决传统存储器问题的理想存储器的候选对象。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Future memory technology including emerging new memories
There have been concerns about how far we can extend the so far so successful conventional semiconductor memories Such as DRAM, SRAM and Flash memory and what will be the future directions of memory development. In this article, we will review the key technical limits of conventional memory scaling and the directions to overcome the problem. In addition, we will review the technical challenges and opportunities of emerging. new memories such as ferroelectric RAM (FRAM), magnetic RAM (MRAM) and phase change RAM (PRAM) which has been recently focused as candidates for ideal memory which can solve the problems of conventional memories.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信