{"title":"用平面线性扫描器测量天线方向图","authors":"Yu-Ying Su, Wen-Jiao Liao","doi":"10.1109/ICMMT.2012.6230228","DOIUrl":null,"url":null,"abstract":"This work propose a novel antenna measurement range configuration that is applicable to millimeter wave band antennas. The antenna pattern measurement process includes sampling the radiated fields from the antenna-under-test with a 2D planar scanner and processing the data with algorithms for position translation and field calibration. Feasibility of the proposed approach is examined via X-band measurements in a planar near field range. Processed patterns show good agreement with the ones derived from conventional far-field range. This relatively simple range configuration can be adopted in the millimeter wave band for precise measurements.","PeriodicalId":421574,"journal":{"name":"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Antenna pattern measurement using a planar linear scanner\",\"authors\":\"Yu-Ying Su, Wen-Jiao Liao\",\"doi\":\"10.1109/ICMMT.2012.6230228\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work propose a novel antenna measurement range configuration that is applicable to millimeter wave band antennas. The antenna pattern measurement process includes sampling the radiated fields from the antenna-under-test with a 2D planar scanner and processing the data with algorithms for position translation and field calibration. Feasibility of the proposed approach is examined via X-band measurements in a planar near field range. Processed patterns show good agreement with the ones derived from conventional far-field range. This relatively simple range configuration can be adopted in the millimeter wave band for precise measurements.\",\"PeriodicalId\":421574,\"journal\":{\"name\":\"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMMT.2012.6230228\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMMT.2012.6230228","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Antenna pattern measurement using a planar linear scanner
This work propose a novel antenna measurement range configuration that is applicable to millimeter wave band antennas. The antenna pattern measurement process includes sampling the radiated fields from the antenna-under-test with a 2D planar scanner and processing the data with algorithms for position translation and field calibration. Feasibility of the proposed approach is examined via X-band measurements in a planar near field range. Processed patterns show good agreement with the ones derived from conventional far-field range. This relatively simple range configuration can be adopted in the millimeter wave band for precise measurements.