{"title":"固体电解质开关的导通可靠性","authors":"N. Banno, T. Sakamoto, S. Fujieda, M. Aono","doi":"10.1109/RELPHY.2008.4558999","DOIUrl":null,"url":null,"abstract":"We examined the ON-state reliability of a solid electrolyte resistive switch,named ldquoNanoBridgerdquo, for programmable logic application. We found a trade-off between turn-off current and ON-state reliability and optimized the ON conductance. Through this optimization, we obtained high durability against DC current of ~0.2 mA at 105degC for 10 years and low turn-off current less than 5 mA. NanoBridge can thus meet the requirements for programmable logic applications.","PeriodicalId":187696,"journal":{"name":"2008 IEEE International Reliability Physics Symposium","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"On-state reliability of solid-electrolyte switch\",\"authors\":\"N. Banno, T. Sakamoto, S. Fujieda, M. Aono\",\"doi\":\"10.1109/RELPHY.2008.4558999\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We examined the ON-state reliability of a solid electrolyte resistive switch,named ldquoNanoBridgerdquo, for programmable logic application. We found a trade-off between turn-off current and ON-state reliability and optimized the ON conductance. Through this optimization, we obtained high durability against DC current of ~0.2 mA at 105degC for 10 years and low turn-off current less than 5 mA. NanoBridge can thus meet the requirements for programmable logic applications.\",\"PeriodicalId\":187696,\"journal\":{\"name\":\"2008 IEEE International Reliability Physics Symposium\",\"volume\":\"80 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RELPHY.2008.4558999\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.2008.4558999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We examined the ON-state reliability of a solid electrolyte resistive switch,named ldquoNanoBridgerdquo, for programmable logic application. We found a trade-off between turn-off current and ON-state reliability and optimized the ON conductance. Through this optimization, we obtained high durability against DC current of ~0.2 mA at 105degC for 10 years and low turn-off current less than 5 mA. NanoBridge can thus meet the requirements for programmable logic applications.
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