Yield: High Performance Analog Circuit Design With Regard To Statistical Aspects

A novel approach to the computer supported design of high performance analog circuits is presented. Circuit design and dimensioning is effectuated utilizing procedural descriptions of the designer's own techniques and given libraries, according to designer-given specifications. Thus the designer is enabled to concentrate on an increased number of inter-dependences between the circuit's properties and specifications than would be possible using manual calculation or fully automatic design systems. Free programmability and an open model interface give flexibility as well as improved design accuracy and novel means of analysis. Taking into account noise and statistical local and global matching calculations the designer can incorporate yield aspects into the design flow. The usage of the YIELD design tool is demonstrated by dimensioning a patented temperature compensated, resistorless, precision current reference with regard to local matching.