测试发电机预选切换低功率内置自检

2012 IEEE 30th VLSI Test Symposium (VTS) Pub Date : 2012-04-23 DOI:10.1109/VTS.2012.6231071

J. Rajski, J. Tyszer, Grzegorz Mrugalski, B. Nadeau-Dostie

{"title":"测试发电机预选切换低功率内置自检","authors":"J. Rajski, J. Tyszer, Grzegorz Mrugalski, B. Nadeau-Dostie","doi":"10.1109/VTS.2012.6231071","DOIUrl":null,"url":null,"abstract":"This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this device to produce binary sequences with low toggling (switching) rates while preserving test coverage achievable by the best-to-date conventional BIST-based PRPGs with negligible impact on test application time.","PeriodicalId":169611,"journal":{"name":"2012 IEEE 30th VLSI Test Symposium (VTS)","volume":"180 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":"{\"title\":\"Test generator with preselected toggling for low power built-in self-test\",\"authors\":\"J. Rajski, J. Tyszer, Grzegorz Mrugalski, B. Nadeau-Dostie\",\"doi\":\"10.1109/VTS.2012.6231071\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this device to produce binary sequences with low toggling (switching) rates while preserving test coverage achievable by the best-to-date conventional BIST-based PRPGs with negligible impact on test application time.\",\"PeriodicalId\":169611,\"journal\":{\"name\":\"2012 IEEE 30th VLSI Test Symposium (VTS)\",\"volume\":\"180 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"40\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 30th VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2012.6231071\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 30th VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2012.6231071","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 40

摘要

提出了一种具有预选切换(PRESTO)功能的伪随机测试模式发生器。它由线性有限状态机(线性反馈移位寄存器或环形发生器)驱动适当的移相器组成，并配备了许多功能，使该设备能够以低切换(切换)率产生二进制序列，同时保持测试覆盖率，这是目前最好的传统基于bist的prpg所能实现的，对测试应用时间的影响可以忽略不计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Test generator with preselected toggling for low power built-in self-test

This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this device to produce binary sequences with low toggling (switching) rates while preserving test coverage achievable by the best-to-date conventional BIST-based PRPGs with negligible impact on test application time.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2012 IEEE 30th VLSI Test Symposium (VTS)

自引率

0.00%

发文量