{"title":"通过FDC的参数化表征,锻造工业4.0中信息物理系统的基本元素","authors":"K. Hui, Leo Ke, S. Sheen","doi":"10.1109/ASMC.2018.8373145","DOIUrl":null,"url":null,"abstract":"Industry 4.0 builds its entirety on the foundation stones of cyber-physical systems and the key to their realizations depend critically on the capability of constructing functioning models of the physical systems. We present an alternative approach to the efficient construction of sufficiently accurate engineering models to capture the governing process dynamics from the available data-streams of semiconductor manufacturing tools. Characterizations of these dynamic parameters provide different insights from those static features of conventional applications of elementary statistics, including their inferences. It also enables integrated formulation of concurrent process-equipment controls, in addition to the wider scope and deeper insights of effective FDC applications.","PeriodicalId":349004,"journal":{"name":"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Forging basic elements of cyber-physical systems in industry 4.0 with parametric characterization for FDC\",\"authors\":\"K. Hui, Leo Ke, S. Sheen\",\"doi\":\"10.1109/ASMC.2018.8373145\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Industry 4.0 builds its entirety on the foundation stones of cyber-physical systems and the key to their realizations depend critically on the capability of constructing functioning models of the physical systems. We present an alternative approach to the efficient construction of sufficiently accurate engineering models to capture the governing process dynamics from the available data-streams of semiconductor manufacturing tools. Characterizations of these dynamic parameters provide different insights from those static features of conventional applications of elementary statistics, including their inferences. It also enables integrated formulation of concurrent process-equipment controls, in addition to the wider scope and deeper insights of effective FDC applications.\",\"PeriodicalId\":349004,\"journal\":{\"name\":\"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC.2018.8373145\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2018.8373145","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Forging basic elements of cyber-physical systems in industry 4.0 with parametric characterization for FDC
Industry 4.0 builds its entirety on the foundation stones of cyber-physical systems and the key to their realizations depend critically on the capability of constructing functioning models of the physical systems. We present an alternative approach to the efficient construction of sufficiently accurate engineering models to capture the governing process dynamics from the available data-streams of semiconductor manufacturing tools. Characterizations of these dynamic parameters provide different insights from those static features of conventional applications of elementary statistics, including their inferences. It also enables integrated formulation of concurrent process-equipment controls, in addition to the wider scope and deeper insights of effective FDC applications.