{"title":"一种组合逻辑故障定位的测试生成方法","authors":"Y. Koga, C. Chen, K. Naemura","doi":"10.1145/1478462.1478473","DOIUrl":null,"url":null,"abstract":"The Path Generating Method is a simple procedure to obtain, from a directed graph, an irredundant set of paths that is sufficient to detect and isolate all distinguishable failures. It was developed as a tool for diagnostic generation at the system level, e.g., to test data paths and register loading and to test a sequence of transfer instructions. But it has been found to be a powerful tool for test generation for combinational logic networks as well.","PeriodicalId":438698,"journal":{"name":"AFIPS '70 (Fall)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1970-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A method of test generation for fault location in combinational logic\",\"authors\":\"Y. Koga, C. Chen, K. Naemura\",\"doi\":\"10.1145/1478462.1478473\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Path Generating Method is a simple procedure to obtain, from a directed graph, an irredundant set of paths that is sufficient to detect and isolate all distinguishable failures. It was developed as a tool for diagnostic generation at the system level, e.g., to test data paths and register loading and to test a sequence of transfer instructions. But it has been found to be a powerful tool for test generation for combinational logic networks as well.\",\"PeriodicalId\":438698,\"journal\":{\"name\":\"AFIPS '70 (Fall)\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1970-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AFIPS '70 (Fall)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1478462.1478473\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AFIPS '70 (Fall)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1478462.1478473","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A method of test generation for fault location in combinational logic
The Path Generating Method is a simple procedure to obtain, from a directed graph, an irredundant set of paths that is sufficient to detect and isolate all distinguishable failures. It was developed as a tool for diagnostic generation at the system level, e.g., to test data paths and register loading and to test a sequence of transfer instructions. But it has been found to be a powerful tool for test generation for combinational logic networks as well.