损耗衬底上特性阻抗测定的新方法

2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017) Pub Date : 2000-06-11 DOI:10.1109/MWSYM.2000.862255

A. Bracale, D. Pasquet, J. Gautier, N. Fel, V. Ferlet, J. Pelloie

{"title":"损耗衬底上特性阻抗测定的新方法","authors":"A. Bracale, D. Pasquet, J. Gautier, N. Fel, V. Ferlet, J. Pelloie","doi":"10.1109/MWSYM.2000.862255","DOIUrl":null,"url":null,"abstract":"This paper presents a new method to straightforwardly estimate the characteristic impedance of transmission lines printed on lossy substrate, and to accurately model transition between two calibrations. Other original points consist of the determination of parasitic elements included in these transitions, and in a clear assessment of the validity of the results.","PeriodicalId":149404,"journal":{"name":"2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017)","volume":"443 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"A new method for characteristic impedance determination on lossy substrate\",\"authors\":\"A. Bracale, D. Pasquet, J. Gautier, N. Fel, V. Ferlet, J. Pelloie\",\"doi\":\"10.1109/MWSYM.2000.862255\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new method to straightforwardly estimate the characteristic impedance of transmission lines printed on lossy substrate, and to accurately model transition between two calibrations. Other original points consist of the determination of parasitic elements included in these transitions, and in a clear assessment of the validity of the results.\",\"PeriodicalId\":149404,\"journal\":{\"name\":\"2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017)\",\"volume\":\"443 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.2000.862255\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2000.862255","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 13

摘要

本文提出了一种新的方法，可以直接估计印刷在有损耗衬底上的传输线的特性阻抗，并精确地模拟两种校准之间的转换。其他原始要点包括确定这些过渡中包含的寄生元素，以及对结果有效性的明确评估。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A new method for characteristic impedance determination on lossy substrate

This paper presents a new method to straightforwardly estimate the characteristic impedance of transmission lines printed on lossy substrate, and to accurately model transition between two calibrations. Other original points consist of the determination of parasitic elements included in these transitions, and in a clear assessment of the validity of the results.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017)

自引率

0.00%

发文量