{"title":"无线应用阻抗匹配探头","authors":"S. Basu, M. Fennelly, J. Pence, E. Strid","doi":"10.1109/ARFTG.1995.327136","DOIUrl":null,"url":null,"abstract":"This work describes the motivation, technology, design, and performance of impedance matching probes that address the needs of wireless applications. The impedance matching solution can be implemented in two distinctly different technologies, air-coplanar and thin-film membrane. Impedance matched probes offer improved load-pull characterization of power, gain and efficiency, and accurate characterization of devices with non-standard impedances.","PeriodicalId":403073,"journal":{"name":"46th ARFTG Conference Digest","volume":"13 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Impedance Matching Probes for Wireless Applications\",\"authors\":\"S. Basu, M. Fennelly, J. Pence, E. Strid\",\"doi\":\"10.1109/ARFTG.1995.327136\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work describes the motivation, technology, design, and performance of impedance matching probes that address the needs of wireless applications. The impedance matching solution can be implemented in two distinctly different technologies, air-coplanar and thin-film membrane. Impedance matched probes offer improved load-pull characterization of power, gain and efficiency, and accurate characterization of devices with non-standard impedances.\",\"PeriodicalId\":403073,\"journal\":{\"name\":\"46th ARFTG Conference Digest\",\"volume\":\"13 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"46th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1995.327136\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"46th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1995.327136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impedance Matching Probes for Wireless Applications
This work describes the motivation, technology, design, and performance of impedance matching probes that address the needs of wireless applications. The impedance matching solution can be implemented in two distinctly different technologies, air-coplanar and thin-film membrane. Impedance matched probes offer improved load-pull characterization of power, gain and efficiency, and accurate characterization of devices with non-standard impedances.