{"title":"使用500千伏断路器控制开关减轻变压器涌流","authors":"R. Barnett, J. H. Nelson","doi":"10.1109/ICHVE.2010.5640859","DOIUrl":null,"url":null,"abstract":"This paper presents post event analyses of three inrush events that caused relay misoperation. It then presents the results of an EMTP study that illustrates the degree to which different techniques can mitigate the transformer inrush transient and compares this to the predicted performance of closing resistors in an identical application. It demonstrates that controlled switching of a transformer adequately mitigates inrush transients.","PeriodicalId":287425,"journal":{"name":"2010 International Conference on High Voltage Engineering and Application","volume":"433 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Transformer inrush mitigation using controlled switching of a 500-kV circuit breaker\",\"authors\":\"R. Barnett, J. H. Nelson\",\"doi\":\"10.1109/ICHVE.2010.5640859\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents post event analyses of three inrush events that caused relay misoperation. It then presents the results of an EMTP study that illustrates the degree to which different techniques can mitigate the transformer inrush transient and compares this to the predicted performance of closing resistors in an identical application. It demonstrates that controlled switching of a transformer adequately mitigates inrush transients.\",\"PeriodicalId\":287425,\"journal\":{\"name\":\"2010 International Conference on High Voltage Engineering and Application\",\"volume\":\"433 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Conference on High Voltage Engineering and Application\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICHVE.2010.5640859\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Conference on High Voltage Engineering and Application","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICHVE.2010.5640859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transformer inrush mitigation using controlled switching of a 500-kV circuit breaker
This paper presents post event analyses of three inrush events that caused relay misoperation. It then presents the results of an EMTP study that illustrates the degree to which different techniques can mitigate the transformer inrush transient and compares this to the predicted performance of closing resistors in an identical application. It demonstrates that controlled switching of a transformer adequately mitigates inrush transients.