23552通道集成电路用于75µm间距的单光子计数像素探测器,ENC为89 e−rms,偏移扩展为19 e−rms,增益扩展为3% rms

P. Maj, P. Grybos, P. Kmon, R. Szczygiel
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引用次数: 11

摘要

我们报告了在多通道混合检测器读出电路中实现像素内偏移和增益校正的新方法。采用CMOS 130 nm工艺设计并制作了23552个75 μm间距方形像素的ASIC原型。每个像素包含电荷敏感放大器、整形器、鉴别器、校正电路和两个14位计数器,等效噪声电荷为89 e- rms,功耗仅为25 μW。测试证明其具有优异的均匀性,偏移扩展为19e- rms,增益扩展仅为3%,rms足以用于彩色x射线成像。本文介绍了该专用集成电路的结构、一种新型晶体管级偏置和增益微调关键模块原理图、测试过程和测试结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
23552-channel IC for single photon counting pixel detectors with 75 µm pitch, ENC of 89 e− rms, 19 e− rms offset spread and 3% rms gain spread
We report on the novel method of an in-pixel offset and gain correction for implementation in multichannel hybrid detector readout circuits. A prototype ASIC consisting of 23552 square shaped pixels of 75 μm pitch was designed and fabricated in CMOS 130 nm technology. Each pixel containing charge sensitive amplifier, shaper, discriminator, correction circuits and two 14-bit counters has an equivalent noise charge of 89 e- rms and dissipates only 25 μW. Tests prove its exceptional uniformity with an offset spread of 19e- rms and the gain spread of only 3%, rms what is good enough for color X-Ray imaging. The paper presents the architecture of the ASIC, a transistor level novel schematic of key blocks used for offset and gain trimming, the testing procedure and its results.
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