{"title":"基于隐式状态枚举的冗余识别和删除","authors":"Hyunwoo Cho, G. Hachtel, F. Somenzi","doi":"10.1109/ICCD.1991.139849","DOIUrl":null,"url":null,"abstract":"The knowledge of the state transition graph (STG) of a sequential circuit helps in generating test sequences and identifying redundancies. The application of algorithms to the identification and removal of redundancies is reported. This strategy is based on traversing the STG of the given circuit and then performing redundancy identification using the reachability information calculated by the traversal. This method considers one candidate redundancy at a time, in an order that tries to minimize the total processing time. Substantial area and delay reductions are achieved. Experiments show that for many circuits 100% of the sequentially redundant faults can be eliminated in very reasonable amounts of time.<<ETX>>","PeriodicalId":239827,"journal":{"name":"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"Redundancy identification and removal based on implicit state enumeration\",\"authors\":\"Hyunwoo Cho, G. Hachtel, F. Somenzi\",\"doi\":\"10.1109/ICCD.1991.139849\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The knowledge of the state transition graph (STG) of a sequential circuit helps in generating test sequences and identifying redundancies. The application of algorithms to the identification and removal of redundancies is reported. This strategy is based on traversing the STG of the given circuit and then performing redundancy identification using the reachability information calculated by the traversal. This method considers one candidate redundancy at a time, in an order that tries to minimize the total processing time. Substantial area and delay reductions are achieved. Experiments show that for many circuits 100% of the sequentially redundant faults can be eliminated in very reasonable amounts of time.<<ETX>>\",\"PeriodicalId\":239827,\"journal\":{\"name\":\"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCD.1991.139849\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991 Proceedings] IEEE International Conference on Computer Design: VLSI in Computers and Processors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.1991.139849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Redundancy identification and removal based on implicit state enumeration
The knowledge of the state transition graph (STG) of a sequential circuit helps in generating test sequences and identifying redundancies. The application of algorithms to the identification and removal of redundancies is reported. This strategy is based on traversing the STG of the given circuit and then performing redundancy identification using the reachability information calculated by the traversal. This method considers one candidate redundancy at a time, in an order that tries to minimize the total processing time. Substantial area and delay reductions are achieved. Experiments show that for many circuits 100% of the sequentially redundant faults can be eliminated in very reasonable amounts of time.<>