Ahmad AlMarashli, J. Anders, J. Becker, M. Ortmanns
{"title":"一个107 dB SFDR, 80 kS/s奈奎斯特速率SAR ADC,采用混合电容式和增量式ΣΔ DAC","authors":"Ahmad AlMarashli, J. Anders, J. Becker, M. Ortmanns","doi":"10.23919/VLSIC.2017.8008494","DOIUrl":null,"url":null,"abstract":"This paper introduces an architecture and design for high resolution, high linearity Nyquist rate SAR ADCs requiring only a single simple calibration at startup. The proposed architecture benefits from an intrinsically linear 1.5 bit ΣΔ DAC to resolve the fine bits of the SAR ADC after a coarse conversion phase with a monotonically switched capacitive DAC. The ΣΔ DAC is also used for a single shot calibration of the coarse CDAC which therefore does not require good matching and can be sized solely upon noise requirements. A prototype was fabricated in 40 nm CMOS, with power supplies of 1.1 V and 2.5 V. It occupies an active area of only 0.074mm2. The prototype achieves a measured peak SFDR of 107 dB and a noise limited SNDR of 84.8 dB at 80 kS/s Nyquist rate operation. The core power consumption is 101 μW at 80 kS/s. In oversampling mode, the ADC achieves an SNDR above 90 dB over a 5 kHz bandwidth.","PeriodicalId":176340,"journal":{"name":"2017 Symposium on VLSI Circuits","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A 107 dB SFDR, 80 kS/s Nyquist-rate SAR ADC using a hybrid capacitive and incremental ΣΔ DAC\",\"authors\":\"Ahmad AlMarashli, J. Anders, J. Becker, M. Ortmanns\",\"doi\":\"10.23919/VLSIC.2017.8008494\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces an architecture and design for high resolution, high linearity Nyquist rate SAR ADCs requiring only a single simple calibration at startup. The proposed architecture benefits from an intrinsically linear 1.5 bit ΣΔ DAC to resolve the fine bits of the SAR ADC after a coarse conversion phase with a monotonically switched capacitive DAC. The ΣΔ DAC is also used for a single shot calibration of the coarse CDAC which therefore does not require good matching and can be sized solely upon noise requirements. A prototype was fabricated in 40 nm CMOS, with power supplies of 1.1 V and 2.5 V. It occupies an active area of only 0.074mm2. The prototype achieves a measured peak SFDR of 107 dB and a noise limited SNDR of 84.8 dB at 80 kS/s Nyquist rate operation. The core power consumption is 101 μW at 80 kS/s. In oversampling mode, the ADC achieves an SNDR above 90 dB over a 5 kHz bandwidth.\",\"PeriodicalId\":176340,\"journal\":{\"name\":\"2017 Symposium on VLSI Circuits\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/VLSIC.2017.8008494\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIC.2017.8008494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 107 dB SFDR, 80 kS/s Nyquist-rate SAR ADC using a hybrid capacitive and incremental ΣΔ DAC
This paper introduces an architecture and design for high resolution, high linearity Nyquist rate SAR ADCs requiring only a single simple calibration at startup. The proposed architecture benefits from an intrinsically linear 1.5 bit ΣΔ DAC to resolve the fine bits of the SAR ADC after a coarse conversion phase with a monotonically switched capacitive DAC. The ΣΔ DAC is also used for a single shot calibration of the coarse CDAC which therefore does not require good matching and can be sized solely upon noise requirements. A prototype was fabricated in 40 nm CMOS, with power supplies of 1.1 V and 2.5 V. It occupies an active area of only 0.074mm2. The prototype achieves a measured peak SFDR of 107 dB and a noise limited SNDR of 84.8 dB at 80 kS/s Nyquist rate operation. The core power consumption is 101 μW at 80 kS/s. In oversampling mode, the ADC achieves an SNDR above 90 dB over a 5 kHz bandwidth.