扫描加密中的流密码和分组密码分析

C. Bharathi, K. Y. Annapurna, Deepali Koppad, K. Sudeendra Kumar
{"title":"扫描加密中的流密码和分组密码分析","authors":"C. Bharathi, K. Y. Annapurna, Deepali Koppad, K. Sudeendra Kumar","doi":"10.1109/PARC52418.2022.9726687","DOIUrl":null,"url":null,"abstract":"Scan-based test methodology is one of the most popular test techniques in VLSI circuits. This methodology increases the testability which in turn improves the fault coverage. For this purpose, the technique uses a chain of scan cells. This becomes a source of attack for an attacker who can observe / control the internal states and use the information for malicious purposes. Hence, security becomes the main concern in the Integrated Circuit (IC) domain since scan chains are the main reason for leakage of confidential information during testing phase. These leakages will help attackers in reverse engineering. Measures against such attacks have to be taken by encrypting the data which flows through the scan chains. Lightweight ciphers can be used for scan chain encryption. In this work, encryption of scan data is done for ISCAS-89 benchmarks and the performance and security properties are evaluated. Lightweight stream and block ciphers are used to perform scan encryption. A comparative analysis between the two techniques is performed in par with the functions related to design cost and security properties.","PeriodicalId":158896,"journal":{"name":"2022 2nd International Conference on Power Electronics & IoT Applications in Renewable Energy and its Control (PARC)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Analysis of Stream and Block Ciphers for Scan Encryption\",\"authors\":\"C. Bharathi, K. Y. Annapurna, Deepali Koppad, K. Sudeendra Kumar\",\"doi\":\"10.1109/PARC52418.2022.9726687\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scan-based test methodology is one of the most popular test techniques in VLSI circuits. This methodology increases the testability which in turn improves the fault coverage. For this purpose, the technique uses a chain of scan cells. This becomes a source of attack for an attacker who can observe / control the internal states and use the information for malicious purposes. Hence, security becomes the main concern in the Integrated Circuit (IC) domain since scan chains are the main reason for leakage of confidential information during testing phase. These leakages will help attackers in reverse engineering. Measures against such attacks have to be taken by encrypting the data which flows through the scan chains. Lightweight ciphers can be used for scan chain encryption. In this work, encryption of scan data is done for ISCAS-89 benchmarks and the performance and security properties are evaluated. Lightweight stream and block ciphers are used to perform scan encryption. A comparative analysis between the two techniques is performed in par with the functions related to design cost and security properties.\",\"PeriodicalId\":158896,\"journal\":{\"name\":\"2022 2nd International Conference on Power Electronics & IoT Applications in Renewable Energy and its Control (PARC)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 2nd International Conference on Power Electronics & IoT Applications in Renewable Energy and its Control (PARC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PARC52418.2022.9726687\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 2nd International Conference on Power Electronics & IoT Applications in Renewable Energy and its Control (PARC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PARC52418.2022.9726687","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

基于扫描的测试方法是VLSI电路中最流行的测试技术之一。这种方法增加了可测试性,从而提高了故障覆盖率。为此,该技术使用了扫描单元链。这成为攻击者的攻击来源,攻击者可以观察/控制内部状态并将信息用于恶意目的。因此,由于扫描链是导致测试阶段机密信息泄露的主要原因,安全性成为集成电路(IC)领域关注的焦点。这些泄漏将帮助攻击者进行逆向工程。对付这种攻击的措施是对流经扫描链的数据进行加密。轻量级密码可以用于扫描链加密。在这项工作中,对ISCAS-89基准测试的扫描数据进行了加密,并对性能和安全特性进行了评估。轻量级的流和块密码用于执行扫描加密。在与设计成本和安全属性相关的功能中,对这两种技术进行了比较分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Analysis of Stream and Block Ciphers for Scan Encryption
Scan-based test methodology is one of the most popular test techniques in VLSI circuits. This methodology increases the testability which in turn improves the fault coverage. For this purpose, the technique uses a chain of scan cells. This becomes a source of attack for an attacker who can observe / control the internal states and use the information for malicious purposes. Hence, security becomes the main concern in the Integrated Circuit (IC) domain since scan chains are the main reason for leakage of confidential information during testing phase. These leakages will help attackers in reverse engineering. Measures against such attacks have to be taken by encrypting the data which flows through the scan chains. Lightweight ciphers can be used for scan chain encryption. In this work, encryption of scan data is done for ISCAS-89 benchmarks and the performance and security properties are evaluated. Lightweight stream and block ciphers are used to perform scan encryption. A comparative analysis between the two techniques is performed in par with the functions related to design cost and security properties.
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