全封装结构频率相关阻抗矩阵的有效评估

A. Chiariello, A. Girardi, C. Iorio, R. Izzi, T. Lessio, A. Maffucci, S. Ventre
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引用次数: 1

摘要

本文研究了复杂全封装结构阻抗矩阵的有效提取问题。这一结果适用于从直流电到频率范围,其中集肤效应明显,但辐射和其他全波效应仍然可以忽略不计。该模型通过在低频和高频限制下对封装的电阻和电抗施加物理一致的行为来识别阻抗矩阵。仅利用阻抗矩阵的5个频率样本就可以进行识别,这些频率样本可以由测量或数值模拟给出。在本文中,我们使用商用3D电磁代码(FastHenry)提供了5个起点和参考值来验证程序。进行了基准测试和案例研究,证实了模型的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Efficient evaluation of the frequency-dependent impedance matrix of full-package structures
The paper deals with the problem of the efficient extraction of the impedance matrix for a complex full-package structure. This result applies to ranges from DC to frequencies for which the skin effect is pronounced but the radiation and other full-wave effects are still negligible. The model identifies the impedance matrix by enforcing a physically consistent behavior to the resistance and reactance of the package in the low and high frequency limits. The identification is made by using only 5 frequency samples of the impedance matrix, which could be either given by measurements or numerical simulations. In this paper we have used a commercial 3D electromagnetic code (FastHenry) to provide the 5 starting points and the reference values to validate the procedure. Benchmark tests and case-studies are carried out, confirming the accuracy of the model.
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