对商业计算半导体中经常发现的漏洞的调查

K. Gotze
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引用次数: 3

摘要

本文总结了一家CPU半导体制造商的设计团队从架构、设计、模拟和si后测试等方面采取的高级安全验证方法。我们回顾了在我们的经验中经常产生漏洞的几个功能领域,描述了在那里经常发现的一些问题,并讨论了为什么这些领域可能会有问题。通过强调这些问题,我们希望鼓励学术界和工业界在技术方面的未来工作,以更好地发现、减轻或预防这些问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A survey of frequently identified vulnerabilities in commercial computing semiconductors
This paper summarizes the high level approach taken to security validation by design teams at a CPU Semiconductor manufacturer from architecture, through design, simulation and post-si testing. We review several functional areas that in our experience frequently yield vulnerabilities, describe some of the issues commonly found there, and touch on why these areas can be problematic. By highlighting these issues we hope to encourage future work in academia and industry on techniques to better find, mitigate, or prevent these problems.
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