三维深度成像与二维强度成像SPAD器件电路的组合设计

Xiangshun Kong, Guisheng Zhao, Xiong Yang, Hao Chen, Feng Yan, Cheng Mao
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引用次数: 1

摘要

本文提出了一种用于三维深度成像和二维强度成像相结合的SP AD器件阵列和电路。2D强度成像和3D距离检测之间的切换可以通过模式选择来实现。片上TDC在3D模式下具有100ps的时间精度,并与2D强度模式共享一个12位计数器。阵列大小为1 × 128,通过旋转或推动相机系统可以获得二维图像。该芯片可应用于激光雷达、深度成像、地形测绘等领域。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Combination Design of 3D Depth Imaging and 2D Intensity Imaging SPAD Device Circuit
In this paper, a SP AD device array and circuit for combination of 3D depth imaging and 2D intensity imaging are proposed. Switching between 2D intensity imaging and 3D distance detection can be achieved by mode selection. The on chip TDC has 100 ps time precision in 3D mode and shares a 12-bit counter with the 2D intensity mode. The array size is 1 × 128 and a two-dimensional image can be obtained by rotating or pushing camera system. The chip can be used in lidar, depth imaging, topographic mapping and other fields.
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