{"title":"使用BIST/可合成测试台方法测试片外NoC协议","authors":"Saif Uddin, Johnny Öberg","doi":"10.1109/NORCHP.2012.6403128","DOIUrl":null,"url":null,"abstract":"To make systems infinitely scalable is the holy grail of chip design and crux that needs to be solved in order to invent a sustainable design methodology. Network-on-Chip (NoC) has been suggested as this solution as it replaces the traditional buses for on-chip interconnection purposes. However, to reach infinite scalability, off-chip extensions to the NoC protocols are needed in order to maintain scalability at an affordable cost of manufacturability. Going off-chip introduces more levels of complexity when it comes to testing, not only should the chip testing be speedy, the off-chip connections must also be testable in a fast manner, the fastest way being a set of BISTs testing the whole structure in parallel. In this paper, we present a BIST approach for testing an off-chip NoC protocol used in a 4×4 Network-on-Chip configuration. It has 16 processor-nodes implemented on four interconnected plesiochronous Altera Stratix-II FPGA boards, each board hosting a Quad-core NoC.","PeriodicalId":332731,"journal":{"name":"NORCHIP 2012","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Testing of an off-chip NoC protocol using a BIST/Synthesizable Testbench approach\",\"authors\":\"Saif Uddin, Johnny Öberg\",\"doi\":\"10.1109/NORCHP.2012.6403128\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To make systems infinitely scalable is the holy grail of chip design and crux that needs to be solved in order to invent a sustainable design methodology. Network-on-Chip (NoC) has been suggested as this solution as it replaces the traditional buses for on-chip interconnection purposes. However, to reach infinite scalability, off-chip extensions to the NoC protocols are needed in order to maintain scalability at an affordable cost of manufacturability. Going off-chip introduces more levels of complexity when it comes to testing, not only should the chip testing be speedy, the off-chip connections must also be testable in a fast manner, the fastest way being a set of BISTs testing the whole structure in parallel. In this paper, we present a BIST approach for testing an off-chip NoC protocol used in a 4×4 Network-on-Chip configuration. It has 16 processor-nodes implemented on four interconnected plesiochronous Altera Stratix-II FPGA boards, each board hosting a Quad-core NoC.\",\"PeriodicalId\":332731,\"journal\":{\"name\":\"NORCHIP 2012\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"NORCHIP 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NORCHP.2012.6403128\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"NORCHIP 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NORCHP.2012.6403128","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testing of an off-chip NoC protocol using a BIST/Synthesizable Testbench approach
To make systems infinitely scalable is the holy grail of chip design and crux that needs to be solved in order to invent a sustainable design methodology. Network-on-Chip (NoC) has been suggested as this solution as it replaces the traditional buses for on-chip interconnection purposes. However, to reach infinite scalability, off-chip extensions to the NoC protocols are needed in order to maintain scalability at an affordable cost of manufacturability. Going off-chip introduces more levels of complexity when it comes to testing, not only should the chip testing be speedy, the off-chip connections must also be testable in a fast manner, the fastest way being a set of BISTs testing the whole structure in parallel. In this paper, we present a BIST approach for testing an off-chip NoC protocol used in a 4×4 Network-on-Chip configuration. It has 16 processor-nodes implemented on four interconnected plesiochronous Altera Stratix-II FPGA boards, each board hosting a Quad-core NoC.