用于分析深亚微米CMOS电路中工艺变异性效应的CAD工具

2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering Pub Date : 2008-07-21 DOI:10.1109/SIBIRCON.2008.4602572

W. Kuzmicz, E. Piwowarska, A. Pfitzner, D. Kasprowicz

{"title":"用于分析深亚微米CMOS电路中工艺变异性效应的CAD工具","authors":"W. Kuzmicz, E. Piwowarska, A. Pfitzner, D. Kasprowicz","doi":"10.1109/SIBIRCON.2008.4602572","DOIUrl":null,"url":null,"abstract":"A special CAD toolset for process, device and circuit statistical simulation is described. Variability is introduced in the process parameter space, not in the space of parameters of the circuit components. As a result, complex dependencies and correlations between process parameters and circuit performance are taken into account in a realistic way. Application to analysis of static current consumption in deep submicron CMOS digital circuits is demonstrated.","PeriodicalId":295946,"journal":{"name":"2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"CAD tools for analysis of process variability effects in deep submicron CMOS circuits\",\"authors\":\"W. Kuzmicz, E. Piwowarska, A. Pfitzner, D. Kasprowicz\",\"doi\":\"10.1109/SIBIRCON.2008.4602572\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A special CAD toolset for process, device and circuit statistical simulation is described. Variability is introduced in the process parameter space, not in the space of parameters of the circuit components. As a result, complex dependencies and correlations between process parameters and circuit performance are taken into account in a realistic way. Application to analysis of static current consumption in deep submicron CMOS digital circuits is demonstrated.\",\"PeriodicalId\":295946,\"journal\":{\"name\":\"2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIBIRCON.2008.4602572\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIBIRCON.2008.4602572","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

介绍了一种用于过程、器件和电路统计仿真的专用CAD工具集。可变性是在工艺参数空间中引入的，而不是在电路元件参数空间中引入的。因此，工艺参数和电路性能之间的复杂依赖关系和相关性被考虑在一个现实的方式。演示了在深亚微米CMOS数字电路静态电流消耗分析中的应用。

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CAD tools for analysis of process variability effects in deep submicron CMOS circuits

A special CAD toolset for process, device and circuit statistical simulation is described. Variability is introduced in the process parameter space, not in the space of parameters of the circuit components. As a result, complex dependencies and correlations between process parameters and circuit performance are taken into account in a realistic way. Application to analysis of static current consumption in deep submicron CMOS digital circuits is demonstrated.

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来源期刊

2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering

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