680nm窗口激光二极管在50- 100mw连续工作下的可靠性

A. Shima, H. Tada, T. Utakouji, T. Motoda, M. Tsugami, H. Higuchi, M. Aiga
{"title":"680nm窗口激光二极管在50- 100mw连续工作下的可靠性","authors":"A. Shima, H. Tada, T. Utakouji, T. Motoda, M. Tsugami, H. Higuchi, M. Aiga","doi":"10.1109/ISLC.1996.558766","DOIUrl":null,"url":null,"abstract":"By reduction of the operating current density due to a long cavity length of 900 /spl mu/m, reliable 5,000-hour operation of 680-nm window lasers has been realized under the conditions of 70 mW at 60/spl deg/C and 100 mW at 40/spl deg/C for the first time.","PeriodicalId":346992,"journal":{"name":"Conference Digest. 15th IEEE International Semiconductor Laser Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Reliability of 680-nm window laser diodes at 50-100 mW CW operation\",\"authors\":\"A. Shima, H. Tada, T. Utakouji, T. Motoda, M. Tsugami, H. Higuchi, M. Aiga\",\"doi\":\"10.1109/ISLC.1996.558766\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"By reduction of the operating current density due to a long cavity length of 900 /spl mu/m, reliable 5,000-hour operation of 680-nm window lasers has been realized under the conditions of 70 mW at 60/spl deg/C and 100 mW at 40/spl deg/C for the first time.\",\"PeriodicalId\":346992,\"journal\":{\"name\":\"Conference Digest. 15th IEEE International Semiconductor Laser Conference\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Digest. 15th IEEE International Semiconductor Laser Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISLC.1996.558766\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Digest. 15th IEEE International Semiconductor Laser Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISLC.1996.558766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

由于腔长900 /spl mu/m,降低了工作电流密度,首次实现了在60/spl℃条件下70 mW和40/spl℃条件下100 mW的680 nm窗口激光器5000小时的可靠工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability of 680-nm window laser diodes at 50-100 mW CW operation
By reduction of the operating current density due to a long cavity length of 900 /spl mu/m, reliable 5,000-hour operation of 680-nm window lasers has been realized under the conditions of 70 mW at 60/spl deg/C and 100 mW at 40/spl deg/C for the first time.
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