{"title":"可重构二维阵列的扫描诊断","authors":"J. Salinas, F. Lombardi","doi":"10.1109/ICWSI.1994.291253","DOIUrl":null,"url":null,"abstract":"This paper presents a new approach for diagnosing (detection and location) reconfigurable two-dimensional arrays. The proposed approach utilizes the augmented switching interconnection network (commonly found in reconfigurable arrays) as multiple parallel scan chains, such that controllability and observability of test vectors can be achieved for each cell. Arrays with homogeneous and nonhomogeneous cells (multipipeline) are analyzed. An example of the application of the proposed approach to an existing array architecture for image processing, is presented.<<ETX>>","PeriodicalId":183733,"journal":{"name":"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Diagnosis of reconfigurable two-dimensional arrays using a scan approach\",\"authors\":\"J. Salinas, F. Lombardi\",\"doi\":\"10.1109/ICWSI.1994.291253\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new approach for diagnosing (detection and location) reconfigurable two-dimensional arrays. The proposed approach utilizes the augmented switching interconnection network (commonly found in reconfigurable arrays) as multiple parallel scan chains, such that controllability and observability of test vectors can be achieved for each cell. Arrays with homogeneous and nonhomogeneous cells (multipipeline) are analyzed. An example of the application of the proposed approach to an existing array architecture for image processing, is presented.<<ETX>>\",\"PeriodicalId\":183733,\"journal\":{\"name\":\"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-01-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICWSI.1994.291253\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 International Conference on Wafer Scale Integration (ICWSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICWSI.1994.291253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Diagnosis of reconfigurable two-dimensional arrays using a scan approach
This paper presents a new approach for diagnosing (detection and location) reconfigurable two-dimensional arrays. The proposed approach utilizes the augmented switching interconnection network (commonly found in reconfigurable arrays) as multiple parallel scan chains, such that controllability and observability of test vectors can be achieved for each cell. Arrays with homogeneous and nonhomogeneous cells (multipipeline) are analyzed. An example of the application of the proposed approach to an existing array architecture for image processing, is presented.<>