{"title":"使用离子束取样的共振电离质谱法","authors":"D. Goeringer, W. Christie","doi":"10.1364/lmd.1987.thc2","DOIUrl":null,"url":null,"abstract":"Sputter atomization/resonance ionization mass spectrometry (SA/RIMS) is a highly sensitive technique for materials analysis which combines ion beam sputtering, resonance ionization, and mass spectrometry. A pulsed beam of high-energy primary ions bombards the sample producing a plume of neutral atoms. The cloud of sputtered neutrals is intersected and ionized by a synchronized, pulsed laser beam tuned to a resonant transition for specific sample atoms. Laser-generated ions are then extracted into a mass spectrometer for mass analysis. Ion beam sputtering allows the sampling process to be highly controlled by varying the energy, current density, and composition of the primary beam; the pulsed nature of the beam results in efficient sample utilization. Use of a micro-focused beam permits imaging of small areas and particles. The pulsed dye laser generates the high optical power necessary to efficiently ionize the sputtered atoms. Mass analysis of the laser-generated ions provides the capability for isotope ratio measurements.","PeriodicalId":331014,"journal":{"name":"Topical Meeting on Lasers in Materials Diagnostics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Resonance Ionization Mass Spectrometry Using Ion-Beam Sampling\",\"authors\":\"D. Goeringer, W. Christie\",\"doi\":\"10.1364/lmd.1987.thc2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Sputter atomization/resonance ionization mass spectrometry (SA/RIMS) is a highly sensitive technique for materials analysis which combines ion beam sputtering, resonance ionization, and mass spectrometry. A pulsed beam of high-energy primary ions bombards the sample producing a plume of neutral atoms. The cloud of sputtered neutrals is intersected and ionized by a synchronized, pulsed laser beam tuned to a resonant transition for specific sample atoms. Laser-generated ions are then extracted into a mass spectrometer for mass analysis. Ion beam sputtering allows the sampling process to be highly controlled by varying the energy, current density, and composition of the primary beam; the pulsed nature of the beam results in efficient sample utilization. Use of a micro-focused beam permits imaging of small areas and particles. The pulsed dye laser generates the high optical power necessary to efficiently ionize the sputtered atoms. Mass analysis of the laser-generated ions provides the capability for isotope ratio measurements.\",\"PeriodicalId\":331014,\"journal\":{\"name\":\"Topical Meeting on Lasers in Materials Diagnostics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Topical Meeting on Lasers in Materials Diagnostics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/lmd.1987.thc2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Lasers in Materials Diagnostics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/lmd.1987.thc2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Resonance Ionization Mass Spectrometry Using Ion-Beam Sampling
Sputter atomization/resonance ionization mass spectrometry (SA/RIMS) is a highly sensitive technique for materials analysis which combines ion beam sputtering, resonance ionization, and mass spectrometry. A pulsed beam of high-energy primary ions bombards the sample producing a plume of neutral atoms. The cloud of sputtered neutrals is intersected and ionized by a synchronized, pulsed laser beam tuned to a resonant transition for specific sample atoms. Laser-generated ions are then extracted into a mass spectrometer for mass analysis. Ion beam sputtering allows the sampling process to be highly controlled by varying the energy, current density, and composition of the primary beam; the pulsed nature of the beam results in efficient sample utilization. Use of a micro-focused beam permits imaging of small areas and particles. The pulsed dye laser generates the high optical power necessary to efficiently ionize the sputtered atoms. Mass analysis of the laser-generated ions provides the capability for isotope ratio measurements.