电路模拟器和紧凑的模型是精确模拟PD SOI交流浮体行为的必要条件

J. Benson, W. Redman-White, C. Easson, N. D'Halleweyn, M. Uren
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引用次数: 0

摘要

对部分耗尽(PD) SOI mosfet的浮体行为的研究已经确定了在弯曲效应开始以下存在频率相关的漏极电导行为(Howes和Redman-White, 1992)。这是由于电容耦合,与自热无关(Caviglia和Iliadis, 1992;Redman-White et al. 1992)。由于与体节点相关的电导在该区域非常低,我们发现PD SOI紧凑模型的制定及其在电路仿真封装中的实现都存在意想不到的约束。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Circuit simulator and compact model requisites for accurate simulation of AC floating body behaviour in PD SOI
Investigations of floating body behaviour of partially depleted (PD) SOI MOSFETs have established the presence of frequency-dependent drain conductance behaviour below the onset of the kink effect (Howes and Redman-White, 1992). This is due to capacitive coupling, and is not related to self-heating (Caviglia and Iliadis, 1992; Redman-White et al. 1992). As the conductances associated with the body node are extremely low in this region, we found that there are unexpected constraints on both the formulation of PD SOI compact models and their implementation in circuit simulation packages.
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