多位记忆存储器的全数字写入方案

N. Taherinejad, Sai Manoj Pudukotai Dinakarrao, Michael Rathmair, A. Jantsch
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引用次数: 12

摘要

忆阻器已用于各种应用,包括单比特和多比特存储单元。记忆电阻器的非线性电压-电流关系经常被视为一个问题,需要复杂的电路和方法来可靠地写入。在本文中,我们利用这一现象,利用数字比特流在单个忆阻器中存储多个比特的信息。首先,我们演示如何从单个忆阻器单元存储和回读两个比特的信息。然后,我们提出了可以提高在单个忆阻器中数字写入2位和3位数据的可靠性的编码方案。为了验证该方法对多比特数据存储的可靠性,我们基于现有最著名的仿真模型进行了仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fully digital write-in scheme for multi-bit memristive storage
Memristors have been used in various applications, including single- and multi-bit storage units. The non-linear voltage-current relation in memristors is often seen as a problem, necessitating complex circuits and methods for a reliable write-in. In this paper, we take advantage of this phenomenon for storing more than one bit of information in a single memristor using digital bit streams. First, we demonstrate how two bits of information can be stored and read back from a single memristor unit. Then, we propose encoding schemes that can enhance the reliability of digitally writing two and three bits of data in a single memristor. To verify the reliability of this method for multi-bit data storage, we have run simulations based on the most prominent simulation models available.
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